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德國MueTec
德國MueTec公司創建于1991年。通過同萊卡Leica Microsystems Semiconductor 公司多年的緊密合作，MueTec在掩膜CD測量方面創立了一套獨有的標準。
MueTec is long-term successfully cooperating with Semiconductor global main-players, manufacturers of micro mechanic components and High Tech companies manufacturing microstructures.

MueTec’s main focus is the field of optical metrology (CD, Overlay, Film Thickness Measurement) as well as microscopic inspection including review.

MueTec cooperates with Vistec Semiconductor Systems GmbH (formerly Leica Microsystems Semiconductor) worldwide.

MueTec-employees know customers requirements and speak their language which enables MueTec to find qualified system solutions cooperating with customers.
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